dc.contributor.authorWong, Joniece Jing Yi
dc.date.accessioned2014-06-04T08:20:41Z
dc.date.available2014-06-04T08:20:41Z
dc.date.copyright2014en_US
dc.date.issued2014
dc.identifier.urihttp://hdl.handle.net/10356/61093
dc.description.abstractPanoramic images were first created in the middle of the 19th century and it became popular in modern days. It has progressed greatly through the use of computer image processing methods to create panoramas digitally. The word ‘panorama’ comes from the Greek words pân and hòrama, which meant ‘to see everything’. [2] An image stitching program is developed by the student to stitch images with an overlapped region. In this final year project, the Scale Invariant Feature Transform (SIFT) algorithm is used to detect interest points and compute their descriptors. These descriptors are used for matching interest points between images, and the images are combined using the information provided by the SIFT descriptors. This report also includes a brief introduction on two other popular interest point detectors, such as the Harris Corner Detector, the Local Binary Detector (LBP), and will focus mainly on the Scale Invariant Feature Transform (SIFT).en_US
dc.format.extent49 p.en_US
dc.language.isoenen_US
dc.rightsNanyang Technological University
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Control and instrumentationen_US
dc.titlePanoramic image stitchingen_US
dc.typeFinal Year Project (FYP)en_US
dc.contributor.supervisorChua Chin Seng (EEE)en_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeELECTRICAL and ELECTRONIC ENGINEERINGen_US


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