Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system
Tajan, John Benedict
Date of Issue2004
School of Electrical and Electronic Engineering
Singapore-MIT Alliance Programme
The highly competitive nature of the ink jet supplies business has resulted in shorter product life cycles and lower profit margins amidst greater customer expectations. The early identification and resolution of sources of yield loss, especially during the product ramp-up stage, is vital to the continued profitability of the HP wafer fabrication facility in Singapore. Conventional yield analysis methods currently being employed have been deemed inadequate in accelerating the identification of potential sources of yield loss. Unconventional yield analysis methodologies which are accurate and easy to use are required to uncover unknown sources of yield loss.