To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit.
Lee, Gee Kean.
Date of Issue2001
School of Mechanical and Aerospace Engineering
This reports covers the basic concepts and methodologies of some non destructive testing (NDT) on a very thin layer of flexible micro-circuit, of polyimide base, used in electronic industry.
Nanyang Technological University