Development of a failure assessment methodology for flip chip electronic assembly.
Yeo, Alfred Swain Hong.
Date of Issue2004
School of Mechanical and Aerospace Engineering
In this project, two different solder bump materials are evaluated, they are lead-based 63Sn/37Pb solder and lead-free 96.5Sn/3.5Ag solder. Their solder joint fatigue lives on flip chip on board (FCOB) assembly are assessed by experimental testing and numerical modeling. FCOB assemblies are subjected to a temperature cycle test profile of -40/125°C. Failure analysis is performed to determine the failure mode and failure location. From the flip chip solder joint fatigue data, a two-parameter Weibull analysis is used to derive the mean time to failure (MTTF). Non-linear FE analysis is used to simulate the flip chip solder joint reliability under the temperature cycling loading condition, based on four different solder constitutive models, such as elastic-plastic, elastic-creep, elastic-plastic-creep and viscoplastic analyses.
Nanyang Technological University