dc.contributor.authorXu, Xiaojing.en_US
dc.date.accessioned2008-09-17T10:20:50Z
dc.date.available2008-09-17T10:20:50Z
dc.date.copyright2003en_US
dc.date.issued2003
dc.identifier.urihttp://hdl.handle.net/10356/5133
dc.description.abstractA shaft-loaded blister test has been developed to study the mechanical performance of thin flexible films deposited on rigid substrate and the interfacial adhesion between them. The aim of this work is to develop a systematic approach in designing thinlayered structures for improved durability through well-controlled experiments and theoretical analysis.en_US
dc.format.extent192 p.
dc.rightsNanyang Technological Universityen_US
dc.subjectDRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
dc.titleMechanical characterization and durability of thin-layered structures.en_US
dc.typeThesisen_US
dc.contributor.supervisorLiao, Kin.en_US
dc.contributor.schoolSchool of Materials Science and Engineeringen_US
dc.description.degreeDOCTOR OF PHILOSOPHY (SME)en_US


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