Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
Tan, Thiam Teck.
Date of Issue2003
School of Materials Science and Engineering
In this work, the Electron Backscattered Diffraction technique was employed to obtain the crystallographic orientation distribution, determine the misorientation of grain boundaries and also map the misorientation distribution in Bi-2223 superconductor tapes.
DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
Nanyang Technological University