Analysis and characterization of ultra thin SOI MOSFET by MEDICI
Shin, Chang Yeop.
Date of Issue2002
School of Materials Science and Engineering
In this work, the charge coupling, breakdown mechanism and self-heating effect were investigated and identified by two-dimensional and two-carrier device simulation. This work provided comprehensive understanding of unique features of ultrathin SOI MOSFETs and contributed to SOI device modeling and design for future high performance, low power/voltage ICs.
DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Nanyang Technological University