Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process.
Date of Issue2001
School of Electrical and Electronic Engineering
The main objective of this project is to analyze one of the functional memory test algorithm, named March tests, which are applied to Random Access Memory for detecting most common faults. Based on this integrated test method, a Driver board that contains Test Pattern Generator as well as auxilliary circuitry is designed for March test operation.
DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
Nanyang Technological University