Application of low frequency noise in the study of VLSI electromigration.
Lim, Shin Yeh.
Date of Issue2002
School of Electrical and Electronic Engineering
The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes.
DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Nanyang Technological University