Noise measurement circuit for avalanche photo diode
Lim, Alvin Tong Wen.
Date of Issue2011
School of Electrical and Electronic Engineering
Avalanche photodiodes (APD) are photodetectors which have higher internal gain compared to the other photodiodes. This is due to impact ionization therefore more sensitive compared to other semiconductor. The project concentrates on the noise measurement circuit for the APD.
DRNTU::Engineering::Electrical and electronic engineering
Nanyang Technological University