Characterization and reliability studies of oxides grown by wet and dry oxidations for 0.25 micrometer CMOS technology.
Chow, Yew Tuck.
Date of Issue2004
School of Electrical and Electronic Engineering
The main focus of this report is to improve the hot-carrier lifetime of a 0.25 micrometer CMOS device.
DRNTU::Engineering::Electrical and electronic engineering::Electric apparatus and materials
Nanyang Technological University