Enabling scanning moire phase shifting interferometry in image processing.
Chin, Chee Hwa.
Date of Issue2004
School of Electrical and Electronic Engineering
A method for on-the-fly 3-D surface profilometry using scanning moire phase shifting interferometry is proposed. The proposed optical setup allows on-the-fly phase shifting analysis without phase shifting mechanism.
DRNTU::Engineering::Electrical and electronic engineering::Electronic systems
Nanyang Technological University