dc.contributor.authorZhou, Jianliang.en_US
dc.date.accessioned2008-09-17T09:43:24Z
dc.date.available2008-09-17T09:43:24Z
dc.date.copyright2001en_US
dc.date.issued2001
dc.identifier.urihttp://hdl.handle.net/10356/4060
dc.description.abstractThe dissertation is to discuss the reality of fast test of PCBA, through the intelligent property reuse, i.e. the Functional Circuit Database developed in this work.en_US
dc.rightsNanyang Technological Universityen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
dc.titleFast test of PCBA.en_US
dc.typeThesisen_US
dc.contributor.supervisorChin, Edward Hsi Ling.en_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeMSC(CONSUMER ELECTRONICS)en_US


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