Image analysis and recognition by affine invariant features.
Date of Issue2002
School of Electrical and Electronic Engineering
This thesis addresses several issues in the field of pattern recognition. The main achievements are in the development of invariant features under affine transformation. For recognition of blur degraded and simultaneously affine deformed images, we proposed a moment based normalization method to construct the blur and affine combined invariant features.
DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
Nanyang Technological University