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      Image analysis and recognition by affine invariant features.

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      EEE-THESES_1815.pdf (10.00Mb)
      Author
      Zhang, Yani.
      Date of Issue
      2002
      School
      School of Electrical and Electronic Engineering
      Abstract
      This thesis addresses several issues in the field of pattern recognition. The main achievements are in the development of invariant features under affine transformation. For recognition of blur degraded and simultaneously affine deformed images, we proposed a moment based normalization method to construct the blur and affine combined invariant features.
      Subject
      DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
      Type
      Thesis
      Rights
      Nanyang Technological University
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      • EEE Theses

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