Development of void growth model during electromigration test.
Yeo, Mei Chun.
Date of Issue2002
School of Electrical and Electronic Engineering
Electromigration (EM) has been researched extensively for the past 30 years. Despite the huge amount of research conducted, electromigration is not yet fully understood. Furthermore, results produced by some researchers are contradictory, which adds confusion onto the deficiency. The cause is mainly the lack of understanding on the diffusion and failure mechanisms during EM.
DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Nanyang Technological University