0.18 um DRAM product electrical failure analysis for prediction of physical defects.
Tej Bahadur Megh Raj.
Date of Issue2004
School of Electrical and Electronic Engineering
Predict possible types of physical defects from electrical failure analysis using the Micromate tester on 0.18 nm technology chips. The results are still applicable to other types of Dynamic Random Access Memory (DRAM).
DRNTU::Engineering::Electrical and electronic engineering::Power electronics
Nanyang Technological University