Control on yield variations between testers using monitoring-test
Seshadri Raghavendra Murali.
Date of Issue2001
School of Electrical and Electronic Engineering
In order to monitor the yield variation, an automated Statistical Process Control (SPC) system is used, which applies Statistics to justify the process variation. This report introduces a new approach, called the MONITOR test as an alternative tool in the overall process control system.
DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation
Nanyang Technological University