Review and analysis of device characterization structures and methodologies used for mixed signal integrated circuits
Purakh Raj Verma.
Date of Issue2003
School of Electrical and Electronic Engineering
This project focues on the evaluation of the various characterization techniques and test structure designs for both active and passive component used in deep sub-micron high frequency mixed signal (analog/digital) integrated circuits. Key device parameters and matching of both passive components (resistors & capacitor) and active components (mainly MOS transistors) are discussed in detail.
DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Nanyang Technological University