Experimental and analytical characterization of short channel MOSFETS
Yeo, Kiat Seng
Date of Issue2000
School of Electrical and Electronic Engineering
Present the characterization of deep-sub-micrometer lightly-Doped Drain pMOSFETS operating in a Bi-MOS structure.
DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Nanyang Technological University