Computer-aided fault analysis of digital circuit
Author
Yip, Chee Soon.
Date of Issue
1992School
School of Electrical and Electronic Engineering
Abstract
Two test pattern generation programs are developed - bd and MoDalg. The bd implements the boolean difference method, an algebraic method that manipulates boolean equations to derive a complete test set for all possible stuck-at faults in the circuit under test.
Subject
DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Type
Thesis
Rights
NANYANG TECHNOLOGICAL UNIVERSITY
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