Computer-aided fault analysis of digital circuit
Yip, Chee Soon.
Date of Issue1992
School of Electrical and Electronic Engineering
Two test pattern generation programs are developed - bd and MoDalg. The bd implements the boolean difference method, an algebraic method that manipulates boolean equations to derive a complete test set for all possible stuck-at faults in the circuit under test.
DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
NANYANG TECHNOLOGICAL UNIVERSITY