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      Computer-aided fault analysis of digital circuit

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      Main report (17.83Mb)
      Author
      Yip, Chee Soon.
      Date of Issue
      1992
      School
      School of Electrical and Electronic Engineering
      Abstract
      Two test pattern generation programs are developed - bd and MoDalg. The bd implements the boolean difference method, an algebraic method that manipulates boolean equations to derive a complete test set for all possible stuck-at faults in the circuit under test.
      Subject
      DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
      Type
      Thesis
      Rights
      NANYANG TECHNOLOGICAL UNIVERSITY
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      • EEE Theses

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